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Bare Silicon-Non-Contact Mode-AFM Probes
BS-NCM-AP- short_desc Bare Silicon AFM Probes for Non-Contact Mode
- Tags : Contact, Mechanical Properties/Force Curves, Non-Contact/Tapping, Phase Imaging Mode
- Categories AFM Probes, Golden
Description
Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and are available without coating (no reflective, no conductive coating). The standard chip sizes make these AFM probes compatible with most AFM manufacturers.
Addional Information
| Quantity | 15, 50, HW, W |
| Cantilever Length | 95 |
| Cantilever Shape | Rectangular |
| Cantilever Thickness | 2 |
| Cantilever Width | 30 |
| Cantilever | Single |
| Coating | None |
| Force Constant [N/m] | 3.1, 11.8, 37.6 |
| Resonant Frequency [kHz] | 140, 240, 390 |
| Tip Material | Silicon |
| Tip | Tetrahedral (Standard) |