Calibrated Single Crystal Diamond Tip -Nanoindentation/ Nanoscratching/ Lithography-aCSCDT-NI/NS/L-a
- short_desc Calibrated Unique Probes with Single Crystal Diamond Tip Specially Designed for Nanoindentation, Nanoscratching, and Lithography
- Tags : Hardened/Enhanced Wear Resistance, Nanoindentation and Lithography
- Categories AFM Probes, Diamond
These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a board cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and are able to image the indents at high resolution in-situ using the same probe. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.
|Force Constant [N/m]||100, 350, 600|
|Resonant Frequency [kHz]||500, 750, 1000|
|Tip||4 Sided Pyramid|