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Golden Silico-Nonconductive-Non-Contact Mode-AFM Probes-d
GS-NNCM-AP-d- short_desc Golden Silicon AFM Probes for Nonconductive Non-Contact Mode
- Tags : Contact, General Topography, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode
- Categories AFM Probes, Golden
Description
Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and come standard with Au reflective coating. The standard chip sizes make these AFM probes compatible with most AFM manufacturers.
Addional Information
| Quantity | 15, 50, HW, W |
| Cantilever 1 Force Constant [N/m] | 5.5, 11.5, 22.5 |
| Cantilever 1 Length | 100 |
| Cantilever 1 Resonant Frequency [kHz] | 190, 255, 325 |
| Cantilever 1 Thickness | 2 |
| Cantilever 1 Width | 35 |
| Cantilever 2 Force Constant [N/m] | 2.5, 5.5, 10 |
| Cantilever 2 Length | 130 |
| Cantilever 2 Resonant Frequency [kHz] | 115, 150, 190 |
| Cantilever 2 Thickness | 2 |
| Cantilever 2 Width | 35 |
| Cantilever Shape | Rectangular |
| Cantilever | Double |
| Coating | Au Reflective |
| Tip Material | Silicon |
| Tip | Tetrahedral (Standard) |