Golden Silico-Nonconductive-Non-Contact Mode-AFM Probes-d

GS-NNCM-AP-d
  • short_desc Golden Silicon AFM Probes for Nonconductive Non-Contact Mode
  • Tags : Contact, General Topography, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode
  • Categories AFM Probes, Golden

Description

Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and come standard with Au reflective coating. The standard chip sizes make these AFM probes compatible with most AFM manufacturers.

Addional Information

Quantity 15, 50, HW, W
Cantilever 1 Force Constant [N/m] 5.5, 11.5, 22.5
Cantilever 1 Length 100
Cantilever 1 Resonant Frequency [kHz] 190, 255, 325
Cantilever 1 Thickness 2
Cantilever 1 Width 35
Cantilever 2 Force Constant [N/m] 2.5, 5.5, 10
Cantilever 2 Length 130
Cantilever 2 Resonant Frequency [kHz] 115, 150, 190
Cantilever 2 Thickness 2
Cantilever 2 Width 35
Cantilever Shape Rectangular
Cantilever Double
Coating Au Reflective
Tip Material Silicon
Tip Tetrahedral (Standard)

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