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Golden Silico-Nonconductive-Non-Contact Mode-AFM Probes-e
GS-NNCM-AP-e- short_desc Golden Silicon AFM Probes for Nonconductive Non-Contact Mode
- Tags : Contact, General Topography, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode
- Categories AFM Probes, Golden
Description
Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and come standard with Au reflective coating. The standard chip sizes make these AFM probes compatible with most AFM manufacturers.
Addional Information
| Quantity | 15, 50, HW, W |
| Cantilever Length | 90 |
| Cantilever Shape | Triangular |
| Cantilever Thickness | 2 |
| Cantilever Width | 60 |
| Cantilever | Single |
| Coating | Au Reflective |
| Force Constant [N/m] | 28, 48, 91 |
| Resonant Frequency [kHz] | 260, 420, 630 |
| Tip Material | Silicon |
| Tip | Tetrahedral (Standard) |