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Golden Silico-Nonconductive-Non-Contact Mode-AFM Probes-f
GS-NNCM-AP-f- short_desc Golden Silicon AFM Probes for Nonconductive Non-Contact Mode
- Tags : Contact, General Topography, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode
- Categories AFM Probes, Golden
Description
Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and come standard with Au reflective coating. The standard chip sizes make these AFM probes compatible with most AFM manufacturers.
Addional Information
| Quantity | 15, 50, HW, W |
| Cantilever Length | 125 |
| Cantilever Shape | Rectangular |
| Cantilever Thickness | 4 |
| Cantilever Width | 40 |
| Cantilever | Single |
| Coating | Au Reflective |
| Force Constant [N/m] | 22, 40, 100 |
| Resonant Frequency [kHz] | 240, 320, 440 |
| Tip Material | Silicon |
| Tip | Tetrahedral (Standard) |