Quote Request
Contact Us
Golden Silicon-Nonconductive-Non-Contact Mode- AFM Probes-a
GS-NNCM-AP-a- short_desc Golden Silicon AFM Probes for Nonconductive Non-Contact Mode
- Tags : Contact, General Topography, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode
- Categories AFM Probes, Golden
Description
Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and come standard with Au reflective coating. The standard chip sizes make these AFM probes compatible with most AFM manufacturers.
Addional Information
| Quantity | 15, 50, HW, W |
| Cantilever Length | 125 |
| Cantilever Shape | Rectangular |
| Cantilever Thickness | 2 |
| Cantilever Width | 30 |
| Cantilever | Single |
| Coating | Au Reflective |
| Force Constant [N/m] | 1.45, 5.1, 15.1 |
| Resonant Frequency [kHz] | 87, 150, 230 |
| Tip Material | Silicon |
| Tip | Tetrahedral (Standard) |