Golden Silicon-Nonconductive-Non-Contact Mode- AFM Probes-c

  • short_desc Golden Silicon AFM Probes for Nonconductive Non-Contact Mode
  • Tags : Contact, General Topography, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode
  • Categories AFM Probes, Golden


Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and come standard with Au reflective coating. The standard chip sizes make these AFM probes compatible with most AFM manufacturers.

Addional Information

Quantity 15, 50, HW, W
Cantilever Length 95
Cantilever Shape Rectangular
Cantilever Thickness 2
Cantilever Width 30
Cantilever Single
Coating Au Reflective
Force Constant [N/m] 3.1, 11.8, 37.6
Resonant Frequency [kHz] 140, 240, 390
Tip Material Silicon
Tip Tetrahedral (Standard)