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Scanning Near Field Optical Microscopes probes-without tuning forks-wavelength 600-770nm
SNF_OMP-c- short_desc SNOM probes (wavelength 600-770nm) for Scanning Near Field Optical Microscopes, without tuning forks
Description
AFM Nanoprobes SNOM probes stand up to the most demanding applications, including infrared and UV/visible range. Our tips are made of high-quality polymers and also come in a variety of coatings to support your testing and imaging needs.Material – single mode optical fiber Nufern 630HP.
Probe tip is coated by Al (70nm)/sublayer V (20nm) .
Tip diameter uncoated by Al (tip aperture) 100 – 150 nm (125±25)
Angle of fiber – about 20 degrees
Maximum optical input power – 400 microWatt
The probes are prepared by chemical etching method.
This method gives the optical efficiency 102 – 104 times better than those obtained by mechanical pulling.GEOMETRICAL & MECHANICAL FIBER SPECIFICATIONS:SNOM PROBE CHARACTERISTICS:
Addional Information
| Quantity | 10 |
| Cantilever | Single |
| Coating | Al Reflective |
| Tip Material | Single mode optical fiber (Basic Nufern fiber) |