Super Sharp Probes+Single Crystal Diamond Tip-Topography Measurements

Description

AFM Nanoprobes offers unique probes with single crystal diamond probes for topography, conductive measurements, and electrical measurements. These long-lasting, and highly conductive, sharp diamond probes are highly resistant to mechanical destruction and keep their sharpness. They enable highly repeatable, high resolution operation to ensure you consistently get the best possible data from your system. Single crystal diamond probes are formed by a unique patented process to ensure the best possible wear and electrical performance. The probes are sharper and last longer than any other electrical AFM probe.