Super Sharp Silicon AFM Probes-01

SSSAP-01
  • short_desc Super Sharp Silicon AFM Probes
  • Tags : Critical Dimension (CDAFM), General Topography, High Resolution Imaging, Trenches/Holes
  • Categories AFM Probes, Golden

Description

Addional Information

Quantity 10
Cantilever Length 225
Cantilever Shape Rectangular
Cantilever Thickness 2.5
Cantilever Width 32
Cantilever Single
Coating Al Reflective
Force Constant [N/m] 0.5, 1, 3
Resonant Frequency [kHz] 47, 70, 90
Tip Material Single Crystal Silicon
Tip Tetrahedral (Standard)

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