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Super Sharp Silicon AFM Probes-10
SSSAP-10- short_desc Super Sharp Silicon AFM Probes
- Tags : Critical Dimension (CDAFM), General Topography, High Resolution Imaging, Trenches/Holes
- Categories AFM Probes, Golden
Description
Addional Information
| Quantity | 10 |
| Cantilever Length | 225 |
| Cantilever Shape | Rectangular |
| Cantilever Thickness | 1 |
| Cantilever Width | 30 |
| Cantilever | Single |
| Coating | Al Reflective |
| Force Constant [N/m] | 0.01, 0.11, 0.5 |
| Resonant Frequency [kHz] | 8, 22, 39 |
| Tip Material | Single Crystal Silicon |
| Tip | Tetrahedral (Standard) |