Super Sharp Silicon AFM Probes-f

SSSAP-f
  • short_desc Super Sharp Silicon AFM Probes
  • Tags : Critical Dimension (CDAFM), General Topography, High Resolution Imaging, Trenches/Holes
  • Categories AFM Probes, Golden

Description

Addional Information

Quantity 10
Cantilever Length 125
Cantilever Shape Rectangular
Cantilever Thickness 4
Cantilever Width 40
Cantilever Single
Coating Al Reflective
Force Constant [N/m] 22, 40, 100
Resonant Frequency [kHz] 200, 320, 440
Tip Material Single Crystal Silicon
Tip Tetrahedral (Standard)

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