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Product Force Constant [N/m]
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APPLICATIONS
- Atomic Force Acoustic Microscopy (AFAM)
- Contact
- Critical Dimension (CDAFM)
- General Topography
- Hardened/Enhanced Wear Resistance
- High Aspect Ratio AFM Probes
- High Resolution Imaging
- Life Sciences
- Liquid Scanning
- Mechanical Properties/Force Curves
- Nanoindentation and Lithography
- Non-Contact/Tipless
- Phase Imaging Mode
- Scanning Near-field Optical Microscopy (SNOM)
- Scanning Thermal Microscopy (SThM)
- Spectroscopy
- Trenches/Holes