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CONDUCTIVE AFM (CAFM)

Conductive AFM (CAFM) is a mode in Atomic Force Microscope (AFM), which simultaneously measures the topography of the material and the current at the contact point between the electrode tip and the sample surface. The sample's shape is measured by using an optical system to detect the deflection of the cantilever, while a current-to-voltage preamplifier is used to detect the current. CAFM usually operates in contact mode. The tip can be held in one position while applying/reading voltage and current signals, or the tip can be moved to scan a specific area of the sample (and collect current) at a constant voltage.

  • AFM-NP-Contact Mode-Silicon Air Probes-Pt

    CMSAP-Pt
  • Frequency: Nom: 13
  • Spring Const.: Nom: 0.2
  • Geometry: Standard (Steep)
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective PtIr

  • Platinum-Deposited Cantilevers Probes

    PDCP
  • Frequency: Nom: 70
  • Spring Const.: Nom: 2
  • Geometry: Visible Apex
  • Tip Radius: 15nm
  • Material: 0.01 - 0.02 Ωcm Silicon
  • Coating: Reflective Aluminum

  • AFM Nanoprobes SCM-PtIr Probe

    SCMPIP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 3.0
  • Geometry: Rotated
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective PtIr

  • AFM Nanoprobes SCM-PtSi Probes

    SCMPSP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Tip Radius: 15nm
  • Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
  • Coating: Reflective Al