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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

FAST SCAN

The fast scanning AFM mode of AFM Nanoprobes is a detection mode that is specially designed to make the scanning speed more than 20 times of typical high-performance AFM. The fast scanning atomic force microscope uses a specially designed high-bandwidth probe to track the surface of the sample with a feedback loop. Each component in the loop has its own dynamic or delay. The sum of the responses of all these components determines the full-speed system transfer function, which determines the speed performance of Fast Scan. Using the fast scanning probe, users can also measure samples at a speed greater than 100 times without affecting or sacrificing image quality and required resolution.

  • AFM-NP Dimension FastScan Probe-a

    AFMNP-DFSP-a
  • Frequency: Nom: 1400
  • Spring Const.: Nom: 18
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 5nm
  • Material: Silicon Nitride
  • Coating: Reflective Aluminum
  • AFM-NP Dimension FastScan Probe-c

    AFMNP-DFSP-c
  • Frequency: Nom: 300
  • Spring Const.: Nom: 0.8
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 5nm
  • Material: Silicon Nitride
  • Coating: Reflective Gold
  • AFM-NP Dimension FastScan Probe-b

    AFMNP-DFSP-b
  • Frequency: Nom: 450
  • Spring Const.: Nom: 1.8
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 5nm
  • Material: Silicon Nitride
  • Coating: Reflective Gold
  • Bioused Mini Probe-0.1

    AFMNP-BMP-0.1
  • Frequency: Nom: 25
  • Spring Const.: Nom: 0.09
  • Geometry: Visible Apex
  • Tip Radius: 8nm
  • Material: Silicon nitride
  • Coating: Reflective Gold
  • AFM-NP Dimension FastScan Probe-d

    AFMNP-DFSP-d
  • Frequency: Nom: 110
  • Spring Const.: Nom: 0.25
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 5nm
  • Coating: Proprietary reflective coating