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  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

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FORCE SPECTROSCOPY

Force spectroscopy is a direct measurement of the force of the needle tip interacting with the sample. The molecules adsorbed on the surface are contacted by probes located at the end of the elastic cantilever. The piezoelectric controller pulls up the cantilever. If a force acts on the elastic cantilever (for example, because some molecules are stretched between the surface and the tip), the force will deflect upward (repulsive force) or downward (gravitational force). According to Hooke's law, this deflection will be proportional to the force acting on the cantilever. The deflection is measured by the position of the laser beam reflected by the cantilever beam.

  • 4 Cantilevers Probes-Au

    4CP-Au
  • Frequency: Nom: 65
  • Spring Const.: Nom: 0.35
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 30nm
  • Material: Silicon Nitride
  • Coating: Reflective Gold

  • 4 Cantilevers-Uncoated Probes

    4CUP
  • Frequency: Nom: 65
  • Spring Const.: Nom: 0.35
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 20nm
  • Material: Silicon Nitride

  • Bioused Mini Probe-0.1

    AFMNP-BMP-0.1
  • Frequency: Nom: 25
  • Spring Const.: Nom: 0.09
  • Geometry: Visible Apex
  • Tip Radius: 8nm
  • Material: Silicon nitride
  • Coating: Reflective Gold

  • AFM-NP-Silicon Nitride AFM Probes-10

    AFMNPSNAP-10
  • Frequency: Nom: 65
  • Spring Const.: Nom: 0.35
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 20nm
  • Material: Silicon Nitride
  • Coating: Reflective Gold

  • Alignment Grooves-Contact Mode Probes

    AGCMP
  • Frequency: Nom: 13
  • Spring Const.: Nom: 0.2
  • Geometry: Standard (Steep)
  • Tip Radius: 7nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Aluminum