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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

LATERAL FORCE MICROSCOPY (LFM)

Lateral force microscopy (LFM) is derived from contact mode imaging. In contact mode, when the cantilever probe is scanned over the entire surface, the resulting image is obtained by changing the position of the sample during scanning and the difference in the frictional force experienced by the needle tip (the "twist" of the needle tip). Lateral scanning (perpendicular to The cantilever of its length) is subjected to greater torsional force when passing through high friction parts, and the torque of low friction parts tends to decrease. The relative measure of the lateral forces encountered along the surface can be plotted against high and low friction points.

In the "contact" mode, a general microscope measures the deflection of the cantilever in the vertical direction to collect sample surface information, while in LFM, the deflection of the cantilever in the horizontal direction is measured. The lateral deflection of the cantilever is the result of the force exerted on the cantilever when the cantilever moves horizontally on the surface of the sample. The magnitude of this deflection depends on the friction coefficient, the morphology of the sample surface, the directional movement of the cantilever, and the lateral direction of the cantilever Spring constant. Therefore, LFM can be used to measure the lack of uniformity of surface materials and generate images with enhanced topographic feature edges, which is very useful for studying samples whose surface is composed of heterogeneous compounds.

  • AFM-NP-Contact Mode-Silicon Air Probes-Al

    CMSAP-Al
  • Frequency: Nom: 13
  • Spring Const.: Nom: 0.2
  • Geometry: Standard (Steep)
  • Tip Radius: 8nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Aluminum
  • AFM-NP-Contact Mode-Silicon Air Probes-No

    CMSAP-No
  • Frequency: Nom: 13
  • Spring Const.: Nom: 0.2
  • Geometry: Standard (Steep)
  • Tip Radius: 8nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Aluminum
  • AFM-NP-Contact Mode-Silicon Air Probes-No-W

    CMSAP-No-W
  • Frequency: Nom: 13
  • Spring Const.: Nom: 0.2
  • Geometry: Standard (Steep)
  • Tip Radius: 8nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Aluminum
  • Etalon

    EAP
  • Force Constant: 2.8, 3.5, 4.2+4.8, 6, 7.2
  • Tip Shape: Octahedral at the base, conic on the last 200 nm
  • Length: 223/183
  • Width: 34/34
  • Thickness: 3/3
  • Etalon-High Accuracy-Contact AFM Probes

    EHA-CAP
  • Force Constant: 0.52, 0.65, 0.78+0.208, 0.26, 0.312
  • Tip Shape: Octahedral at the base, conic on the last 200 nm
  • Length: 264/364
  • Width: 34/34
  • Thickness: 1.85/1.85
  • Coating: Au Reflective