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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

MAGNETIC FORCE MICROSCOPY (MFM) AFM PROBES

Magnetic force microscopy (MFM) is a phase imaging mode that uses an atomic force microscope cantilever and a thin magnetic coating to detect the magnetic field between the sample and the magnetized tip. This method is usually used to image any material with non-uniform magnetic properties. It can operate in single, interlaced and dual scan line modes. A magnetic force microscope (MFM) combines tapping mode, lifting mode, and magnetized tip to collect information on the magnetic field above the sample. Use tapping Mode to scan each sample line to obtain terrain data first. The terrain information is stored and retraced using Lift Offset in LiftMode, and then magnetic data is collected.

In MFM, the magnetic force of the sample on the magnetized tip is measured. During this measurement, the tip is lifted from the surface to separate the long-distance magnetic force between the tip and the sample from the short-distance atomic force. The magnetic force microscope operates in amplitude modulation mode, which is a dynamic force mode in which a cantilever with a thin magnetic coating is driven at its resonance frequency, usually at tens or hundreds of kilohertz (this is the percussion mode). When the oscillating cantilever crosses the sample at a specified height, MFM plots its phase and frequency. The repulsive magnetic gradient causes the resonance curve to move to a higher frequency, accompanied by an increase in phase shift (bright contrast). Conversely, an attractive magnetic gradient causes the resonance curve to move to a lower frequency with a reduction in phase shift (dark contrast). The advantages of running MFM in dynamic mode are lower noise and higher resolution. Tip sampling distance is a key parameter to optimize effective MFM operation. If the needle tip is too far from the sample, the resolution will be affected. If the needle tip is too close to the sample, the morphology will be convolved into the MFM signal, which complicates the interpretatio

  • Alignment Grooves-MFM Probes

    AGMFMP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: High Aspect Ratio
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Aluminum
  • Magnetic Force Microscopy Probe-Co-Cr

    MFMP-Co-Cr
  • Frequency: Nom: 75
  • Spring Const.: Nom: 3.0
  • Geometry: Rotated
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective CoCr
  • Value Line-Magnetic Silicon Probes-10

    VLMSP-10
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Tip Radius: 40nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective CoCr
  • High Aspect Ratio Needle probes-a

    HAR-NP-a
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective
  • High Aspect Ratio Needle probes-c

    HAR-NP-c
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective
  • High Aspect Ratio Needle probes-b

    HAR-NP-b
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective