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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

NON-CONTACT / TAPPING MODE AFM PROBES

Non-contact atomic force microscope (NC-AFM), also known as dynamic force microscope (DFM), is a model of atomic force microscope, which is itself a type of scanning probe microscope. In 1987, Martin et al. Developed the first non-contact atomic force microscope.NC-AFM is very popular because of its own advantages. For example, there is no repulsive force (appears in Contact AFM), which can be used to image "soft" samples; compared to SEM, no conductive sample is needed, and the tip does not contact the sample No damage to the sample. NC-AFM measures surface topography by using the attractive force between atoms between the tip probe and the sample surface. In NC-AFM, a sharp probe is moved near the surface to be studied (on the order of Angstroms), then the raster is scanned over the entire surface, and the image is constructed based on the force interactions during the scanning process. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During the measurement, the sensor is driven to oscillate. Force interaction can be measured by measuring the change in amplitude at a constant frequency (amplitude modulation), or by measuring the change in resonant frequency directly using a feedback circuit (frequency modulation).

  • Alignment Grooves-High-Aspect Ratio Probes

    AGHARP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Platinum/ Iridium
  • Focused Ion Beam Millin-High Aspect Ratio Tip

    FIBMHART
  • Frequency: Nom: 320
  • Spring Const.: Nom: 42
  • Geometry: High Aspect Ratio
  • Tip Radius: 10nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Aluminum
  • 4 Cantilevers Probes-Au

    4CP-Au
  • Frequency: Nom: 65
  • Spring Const.: Nom: 0.35
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 30nm
  • Material: Silicon Nitride
  • Coating: Reflective Gold
  • 4 Cantilevers-Uncoated Probes

    4CUP
  • Frequency: Nom: 65
  • Spring Const.: Nom: 0.35
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 20nm
  • Material: Silicon Nitride
  • Bioused Mini Probe-0.1

    AFMNP-BMP-0.1
  • Frequency: Nom: 25
  • Spring Const.: Nom: 0.09
  • Geometry: Visible Apex
  • Tip Radius: 8nm
  • Material: Silicon nitride
  • Coating: Reflective Gold