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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

PEAKFORCE DEEP TRENCH

PeakForce Deep Trench (PFDT) series probes are carefully designed to provide accurate depth measurement and imaging for challenging structures encountered on semiconductor samples and optical devices, including large aspect ratios, trenches and pits with a depth of more than 100nm.