• Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip


Nano-scale electrical characterization through AFM-based conductivity measurement is a common detected method for nano-scale electrical characterization. Conductive AFM in the high current range (CAFM) and tunnel AFM in the low current range (TUNA) are two categories of AFM conductivity measurement. Among them, CAFM is a widely used technology, and TUNA represents the sensing module, and the measurement technology of all current levels. The function of TUNA depends on the key elements, namely the current sensor, the conductive AFM probe and the basic mode of AFM.

In this mode, the AFM cantilever oscillates in its basic flexural resonance mode, thereby eliminating the lateral force limitation during imaging as in the contact mode. Due to the high mechanical Q of the cantilever, the vertical interaction force will be reduced when imaging soft and delicate samples. In addition, since the tip has minimal contact, there is no tip wear. PeakForce TUNA is based on the peak force tapping method, and can obtain the peak force quantitative nanomechanical measurement (QNM).

  • AFM Nanoprobes SCM-PtSi Probes

  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Tip Radius: 15nm
  • Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
  • Coating: Reflective Al