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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

SCANNING ELECTROCHEMICAL POTENTIAL MICROSCOPY (SECPM)

Scanning Electrochemical Potential Microscope (SECPM) is a probe microscope that uses a sharp needle as an afm probe. Among them, the sharp tip is connected to a high impedance amplifier. The detector signal is the potential difference between the AFM tip and the sample (or between the AFM tip and the reference electrode) in an ionic or polar liquid. The spatial resolution provided by SECPM is much higher than that expected based on the mechanism that the tip responds to the local electrochemical potential of the solution. In fact, it can achieve atomic resolution similar to STM, but it is an advanced technology for imaging electronically insulated objects (such as proteins) on metal surfaces. In addition to generating topographic information, SECM is often used to probe the surface reactivity of solid materials, electrocatalyst materials, enzymes, and other biophysical systems. In addition, SECM and its technological changes have also been used in micromachining, surface patterning and microstructuring.

  • High Aspect Ratio Needle probes-a

    HAR-NP-a
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective
  • High Aspect Ratio Needle probes-b

    HAR-NP-b
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective
  • High Aspect Ratio Needle probes-c

    HAR-NP-c
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective