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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

SURFACE POTENTIAL MICROSCOPY (SPOM)

Surface potential microscope (SPoM) has the function of simultaneously measuring surface topography and surface potential (VDC) information. Based on the macro-Kelvin method, the Tapping Mode is used to acquire the terrain through the conductive afm tip, and the potential information is extracted by applying AC and DC voltage to the afm tip. Among them, the total voltage acting on the tip is: V = VDC + VAC sin (Ωt). The DC voltage of each tip is adjusted to zero through a dedicated feedback loop, so that the contact potential difference between the tip and the surface of each pixel is zero, so that DC becomes a measure of the surface potential.

  • Alignment Grooves-EFM Probes

    AGEFMP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Platinum/ Iridium
  • Alignment Grooves-MFM Probes

    AGMFMP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: High Aspect Ratio
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Aluminum
  • AFM-NP-Contact Mode-Silicon Air Probes-Pt

    CMSAP-Pt
  • Frequency: Nom: 13
  • Spring Const.: Nom: 0.2
  • Geometry: Standard (Steep)
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective PtIr
  • Magnetic Force Microscopy Probe-Co-Cr

    MFMP-Co-Cr
  • Frequency: Nom: 75
  • Spring Const.: Nom: 3.0
  • Geometry: Rotated
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective CoCr
  • Platinum-Deposited Cantilevers Probes

    PDCP
  • Frequency: Nom: 70
  • Spring Const.: Nom: 2
  • Geometry: Visible Apex
  • Tip Radius: 15nm
  • Material: 0.01 - 0.02 Ωcm Silicon
  • Coating: Reflective Aluminum
  • Peak Force-Sharp Nitride Lever Probes-10

    PFSNLP-10
  • Frequency: Nom: 300
  • Spring Const.: Nom: 0.8
  • Geometry: Rotated (Symmetric)
  • Tip Radius: 5nm
  • Material: Silicon Nitride
  • Coating: Proprietary reflective coating
  • AFM Nanoprobes SCM-PtIr Probe

    SCMPIP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 3.0
  • Geometry: Rotated
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective PtIr
  • AFM Nanoprobes SCM-PtSi Probes

    SCMPSP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Tip Radius: 15nm
  • Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
  • Coating: Reflective Al
  • Value Line-Magnetic Silicon Probes-10

    VLMSP-10
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Tip Radius: 40nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective CoCr