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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

TORSIONAL RESONANCE (TR)

In torsional resonance (TR) mode, the tip of the atomic force microscope (AFM) moves parallel (relative to perpendicular) relative to the surface. In order to maintain a constant distance between the probe and the surface of the test sample, a force that causes a beneficial change in resonance behavior is applied between the AFM probe and the sample. Finally, the changes in the torsion-related dynamic characteristics of the tip-cantilever system caused by the in-plane (lateral) tip-sample interaction are used for surface property imaging. The main benefit of TR mode is that the tip always maintains a constant distance from the surface. This is especially useful in TUNA or near-field optical experiments.

  • AFM Nanoprobes SCM-PtSi Probes

    SCMPSP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Tip Radius: 15nm
  • Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
  • Coating: Reflective Al
  • High Aspect Ratio Needle probes-a

    HAR-NP-a
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective
  • High Aspect Ratio Needle probes-b

    HAR-NP-b
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective
  • High Aspect Ratio Needle probes-c

    HAR-NP-c
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective