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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

ELECTROSTATIC FORCE MICROSCOPY

AFM can be used to detect various electrical characteristics on the surface of materials. These methods can be run in static mode or dynamic mode based on the information to be detected. Detection properties such as current, conductance, surface potential and capacitance are becoming increasingly important in many applications including semiconductors, solar cells and batteries, conductive polymers and nanoelectronics. These applications require the measurement of the electrical performance of increasingly miniaturized equipment and functional components. For these applications, testing is usually done in the form of a traditional silicon AFM cantilever coated with a conductive coating combined with specialized techniques. Among them, the probe made of conductive diamond is more suitable for some of these methods. All these modes provide sample morphology and electrical characteristics data.

Electrostatic force microscopy (EFM) uses a combination of Tapping Mode, Lift Mode and a conductive afm tip to provide information about the electric field on a conductive sample. Among them, each sample line is scanned by Tapping Mode to obtain terrain data first. The terrain information is stored and retraced with a height offset in lift mode, and then electrical data is collected.

  • Alignment Grooves-EFM Probes

    AGEFMP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Platinum/ Iridium
  • Alignment Grooves-MFM Probes

    AGMFMP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: High Aspect Ratio
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective Aluminum
  • AFM-NP-Contact Mode-Silicon Air Probes-Pt

    CMSAP-Pt
  • Frequency: Nom: 13
  • Spring Const.: Nom: 0.2
  • Geometry: Standard (Steep)
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective PtIr
  • Magnetic Force Microscopy Probe-Co-Cr

    MFMP-Co-Cr
  • Frequency: Nom: 75
  • Spring Const.: Nom: 3.0
  • Geometry: Rotated
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective CoCr
  • Platinum-Deposited Cantilevers Probes

    PDCP
  • Frequency: Nom: 70
  • Spring Const.: Nom: 2
  • Geometry: Visible Apex
  • Tip Radius: 15nm
  • Material: 0.01 - 0.02 Ωcm Silicon
  • Coating: Reflective Aluminum
  • AFM Nanoprobes SCM-PtIr Probe

    SCMPIP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 3.0
  • Geometry: Rotated
  • Tip Radius: 25nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective PtIr
  • AFM Nanoprobes SCM-PtSi Probes

    SCMPSP
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Tip Radius: 15nm
  • Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
  • Coating: Reflective Al
  • Value Line-Magnetic Silicon Probes-10

    VLMSP-10
  • Frequency: Nom: 75
  • Spring Const.: Nom: 2.8
  • Geometry: Standard (Steep)
  • Tip Radius: 40nm
  • Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
  • Coating: Reflective CoCr