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PEAKFORCE QNM
Peak Force Tapping mode, the core technology behind PeakForce QNM mode is Peak Force Tapping mode, which executes a very fast force curve at each pixel in the image. The peak interaction force of each of these force curves is then used as an imaging feedback signal. PeakForce QNM produces height images and quantitative nano-mechanical sample property images at the same time.
Continuously Monitor Image Quality-Automatically Parameter Adjustments-Probe
CMIQAPAP- Frequency: Nom: 70
- Spring Const.: Nom: 0.4
- Geometry: Rotated (Symmetric)
- Tip Radius: 2nm
- Material: Silicon Nitride
- Coating: Reflective Aluminum
High Quality-Hard Tapping/Other Non-contact Modes-Etched Silicon Probes-Al-3
HQHTONESP-Al3- Frequency: Nom: 525
- Spring Const.: Nom: 200
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
High Quality-Soft Tapping/Other Non-contact Modes-Etched Silicon Probes-1
HQSTONESP-1- Frequency: Nom: 150
- Spring Const.: Nom: 5
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
High Quality-Soft Tapping/Other Non-contact Modes-Etched Silicon Probes-2
HQSTONESP-2- Frequency: Nom: 300
- Spring Const.: Nom: 40
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
High Quality-Soft Tapping/Other Non-contact Modes-Etched Silicon Probes-3
HQSTONESP-3- Frequency: Nom: 525
- Spring Const.: Nom: 200
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
High Quality-Soft Tapping/Other Non-contact Modes-Etched Silicon Probes-Al-3
HQSTONESP-Al3- Frequency: Nom: 150
- Spring Const.: Nom: 5
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
High Quality-Soft Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-3
HQSTONESWP-3- Frequency: Nom: 150
- Spring Const.: Nom: 5
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
High Quality-Soft Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-Al-3
HQSTONESWP-Al3- Frequency: Nom: 150
- Spring Const.: Nom: 5
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
High Quality-Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-2
HQTONESWP-2- Frequency: Nom: 300
- Spring Const.: Nom: 40
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
High Quality-Hard Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-3
HQTONESWP-3- Frequency: Nom: 525
- Spring Const.: Nom: 200
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
High Quality-Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-Al-2
HQTONESWP-Al2- Frequency: Nom: 300
- Spring Const.: Nom: 40
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
High Quality-Hard Tapping/Other Non-contact Modes-Etched Silicon Wafer Probes-Al-3
HQTONESWP-Al3- Frequency: Nom: 525
- Spring Const.: Nom: 200
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
High Quality-Tapping/Other Non-contact Modes-Etched Silicon Probes-Al-2
HQTONMESP-Al2- Frequency: Nom: 300
- Spring Const.: Nom: 40
- Geometry: Rotated (Symmetric)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
High Spring-Hand Crafted Natural Diamond Nanoindenting Tip
HSHCNDNT-2- Frequency: Nom: 70
- Spring Const.: Nom: 450
- Geometry: Rotated (Symmetric)
- Tip Radius: 40nm
- Material: Stainless Steel
Low Spring Constant-High Sensitivity-Sharpness Silicon Tip-1
LSCHSSST-1- Frequency: Nom: 65
- Spring Const.: Nom: 0.35
- Geometry: Rotated (Symmetric)
- Tip Radius: 2nm
- Material: Silicon Nitride
- Coating: Reflective Gold
Low Spring Constant-High Sensitivity-Sharpness Silicon Tip-2
LSCHSSST-2- Frequency: Nom: 65
- Spring Const.: Nom: 0.35
- Geometry: Rotated (Symmetric)
- Tip Radius: 2nm
- Material: Silicon Nitride
- Coating: Reflective Gold
Sharp Conductive Single Crystal Diamond Probes-0.5
SCSCDP-0.5- Frequency: Nom: 30
- Spring Const.: Nom: 0.5
- Geometry: Standard
- Tip Radius: 10 ± 5nm
- Coating: Reflective Au
Sharp Conductive Single Crystal Diamond Probes-2.8
SCSCDP-2.8- Frequency: Nom: 65
- Spring Const.: Nom: 2.8
- Geometry: Standard
- Tip Radius: 10 ± 5nm
- Coating: Reflective Au
Sharp Conductive Single Crystal Diamond Probes-40
SCSCDP-40- Frequency: Nom: 180
- Spring Const.: Nom: 40
- Geometry: Standard
- Tip Radius: 10 ± 5nm
- Coating: Reflective Au
Super Sharp Conductive Single Crystal Diamond Probes-0.5
SSCSCDP-0.5- Frequency: Nom: 30
- Spring Const.: Nom: 0.5
- Geometry: Standard
- Tip Radius: <5nm
- Coating: Reflective Au
Super Sharp Conductive Single Crystal Diamond Probes-2.8
SSCSCDP-2.8- Frequency: Nom: 65
- Spring Const.: Nom: 2.8
- Geometry: Standard
- Tip Radius: <5nm
- Coating: Reflective Au