Filters
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Product Force Constant [N/m]
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Resonant Frequency [kHz]
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Cantilever
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Coating
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Tip
PEAKFORCE TAPPING
PeakForce Tapping is an AFM mode in which the cantilever is far below resonance. This mode can form a series of continuous force-distance curves through detection. While keeping the peak force constant through direct force control, it is also possible to extract and quantify a variety of material properties from the force-distance curve at each pixel in the image, including modulus, adhesion and depth of deformation. The advantage of PeakForce Tapping is that it uses a constant feedback loop to adjust the relative position of the tip sample. PeakForce tapping uses a sine slope instead of a linear slope, so when the tip is close to the surface, the tip speed is close to zero. These functions ensure precise and direct control of the tip sample interaction force, enabling imaging in fluid with a force of 100pN or less.
4 Cantilevers-Uncoated Probes
4CUP- Frequency: Nom: 65
- Spring Const.: Nom: 0.35
- Geometry: Rotated (Symmetric)
- Tip Radius: 20nm
- Material: Silicon Nitride
AFM-NP Dimension FastScan Probe-d
AFMNP-DFSP-d- Frequency: Nom: 110
- Spring Const.: Nom: 0.25
- Geometry: Rotated (Symmetric)
- Tip Radius: 5nm
- Coating: Proprietary reflective coating
AFM-NP Dimension FastScan Super Sharp Probe-d
AFMNP-DFSSSP-d- Frequency: Nom: 110
- Spring Const.: Nom: 0.25
- Geometry: Rotated (Symmetric)
- Tip Radius: 1nm
- Coating: Proprietary reflective coating
AFM-NP-Silicon Nitride AFM Probes-10
AFMNPSNAP-10- Frequency: Nom: 65
- Spring Const.: Nom: 0.35
- Geometry: Rotated (Symmetric)
- Tip Radius: 20nm
- Material: Silicon Nitride
- Coating: Reflective Gold
Contact Imaging/Force Modulation/Liquid Operation-Soft Silicon Nitride Cantilevers and Sharpened Tips
CFMLOSSNCT- Frequency: Nom: 22
- Spring Const.: Nom: 0.07
- Geometry: Rotated (Symmetric)
- Tip Radius: 10nm
- Material: Silicon Nitride
- Coating: Reflective Gold
Contact Imaging/Force Modulation/Liquid Operation-Soft Silicon Nitride Cantilevers and Tips
CIFMLOSSNCT- Frequency: Nom: 22
- Spring Const.: Nom: 0.07
- Geometry: Rotated (Symmetric)
- Tip Radius: 20nm
- Material: Silicon Nitride
- Coating: Reflective Gold
Continuously Monitor Image Quality-Automatically Parameter Adjustments-Probe
CMIQAPAP- Frequency: Nom: 70
- Spring Const.: Nom: 0.4
- Geometry: Rotated (Symmetric)
- Tip Radius: 2nm
- Material: Silicon Nitride
- Coating: Reflective Aluminum
Shielded Co-axial Sensor Nitride Probe-1
DCSNP-1- Frequency: Nom: 19
- Spring Const.: Nom: 1.0
- Geometry: Pyramid
- Tip Radius: 50 ± 10nm
- Material: Silicon Nitride
- Coating: TiW/Au (500)
Dhielded Co-axial Sensor Nitride Probe-2
DCSNP-2- Frequency: Nom: 75
- Spring Const.: Nom: 8
- Geometry: Pyramid
- Tip Radius: 50 ± 10nm
- Material: Silicon Nitride
- Coating: TiW/Au (500)
Fluid Imaging/Biological Samples-Probe
FIBSP- Frequency: Nom: 22
- Spring Const.: Nom: 0.07
- Geometry: Pyramidal
- Tip Radius: 20nm
- Coating: Reflective Gold
Force Measurements-Extremely Delicate Samples-Fluid-Dull Tip
FMEDSFDT- Frequency: Nom: 150
- Spring Const.: Nom: 0.7
- Geometry: Rotated (Symmetric)
- Tip Radius: 20nm
- Material: Silicon Nitride
- Coating: Reflective Gold
High Optical Reflectivity Samples-New ScanAsyst/PeakForce Tapping Probes
HORSNSPTP- Frequency: Nom: 55
- Spring Const.: Nom: 0.25
- Geometry: Rotated
- Tip Radius: 2nm
- Material: Silicon Nitride
- Coating: Reflective Al
High Quality Long-Lever-Tapping Mode/Non-Contact Mode-Etched Silicon Probes-10
HQLLTNESP-10- Frequency: Nom: 190
- Spring Const.: Nom: 48
- Geometry: Standard (Steep)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
High Quality Long-Lever-Tapping Mode/Non-Contact Mode-Etched Silicon Probes-Al-10
HQLLTNESP-Al-10- Frequency: Nom: 190
- Spring Const.: Nom: 48
- Geometry: Standard (Steep)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
High Quality Long-Lever-Tapping Mode/Non-Contact Mode-Etched Silicon Wafer Probes
HQLLTNESWP- Frequency: Nom: 190
- Spring Const.: Nom: 48
- Geometry: Standard (Steep)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
High Quality Long-Lever-Tapping Mode/Non-Contact Mode-Etched Silicon Wafer Probes-10
HQLLTNESWP-10- Frequency: Nom: 190
- Spring Const.: Nom: 48
- Geometry: Standard (Steep)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
AFM-NP High Quality-Soft Tapping Mode Imaging and Force Modulation-Etched Silicon Probes-10
HQSTM-FMESP-10- Frequency: Nom: 75
- Spring Const.: Nom: 2.8
- Geometry: Standard (Steep)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
AFM-NP High Quality-Soft Tapping Mode Imaging and Force Modulation-Etched Silicon Probes-Al-10
HQSTM-FM-ESP-Al-10- Frequency: Nom: 75
- Spring Const.: Nom: 2.8
- Geometry: Standard (Steep)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
AFM-NP High Quality-Soft Tapping Mode Imaging and Force Modulation-Al-Etched Silicon Wafer Probes-10
HQSTM-FMESP-Al-10- Frequency: Nom: 75
- Spring Const.: Nom: 2.8
- Geometry: Standard (Steep)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
AFM-NP High Quality-Soft Tapping Mode Imaging and Force Modulation-Etched Silicon Wafer Probes
HQSTM-FMESWP- Frequency: Nom: 75
- Spring Const.: Nom: 2.8
- Geometry: Standard (Steep)
- Tip Radius: 8nm
- Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
- Coating: Reflective Aluminum
AFM-NP Higher-Resolution-Contact/Fluid Tapping Mode-Silicon Nitride Probes-10
HRCFTSNP-10- Frequency: Nom: 65
- Spring Const.: Nom: 0.35
- Geometry: Rotated (Symmetric)
- Tip Radius: 10nm
- Material: Silicon Nitride
- Coating: Reflective Gold