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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

SCANNING TUNNELING MICROSCOPY (STM)

STM uses a metal needle as the aFM tip and is one of the highest resolution AFM technologies. STM is based on the concept of quantum tunneling. When the conductive tip is very close to the surface to be inspected, the bias (voltage difference) applied between the two can cause electrons to tunnel in the vacuum between them. The resulting tunneling current is a function of tip position, applied voltage and local density of sample state (LDOS). When the position of the tip is scanned over the entire surface, information is obtained by monitoring the current, and the information is displayed in the form of an image. STM can be used not only in ultra-high vacuum, but also in air, water and various other liquid or gas environments, with a temperature range from close to zero Kelvin to over 1000°C.

  • High Aspect Ratio Needle probes-a

    HAR-NP-a
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective
  • High Aspect Ratio Needle probes-b

    HAR-NP-b
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective
  • High Aspect Ratio Needle probes-c

    HAR-NP-c
  • Resonant Frequency kHz: 9, 13, 17
  • Force Constant: 0.07, 0.4, 2
  • Tip Shape: Tetrahedral (Standard)
  • Length: 450
  • Width: 50
  • Thickness: 2
  • Coating: Au Reflective