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Filters

  • Product Force Constant [N/m]

  • Resonant Frequency [kHz]

  • Cantilever

  • Coating

  • Tip

TIP ENHANCED RAMAN SPECTROSCOPY (TERS)

Tip Enhanced Raman Spectroscopy is a specialized method of Surface Enhanced Raman Spectroscopy (SERS), in which enhanced Raman scattering only occurs at points close to the tip, usually coated with a gold coating. The scanning probe microscope and the confocal Raman spectrometer are integrated through the AFM and Raman system, in which optical-mechanical coupling. Scanning probe microscope can perform nano-scale imaging, optical coupling brings the excitation laser to the functionalized tip (or probe), and the spectrometer analyzes Raman (or other scattered) light to provide a hyperspectral image with nano-scale chemical contrast. The TERS system is based on a metal tip, which concentrates the incident light field on the apex. As a nano-light source and local field enhancer, the tip of the needle greatly improves the Raman sensitivity and reduces the detection volume to the nanometer area below the tip. TERS extends the application range of AFM beyond topographic imaging and combines it with true nanoscale spectral information.