Bare Silicon-Non-Contact Mode-AFM Probes

  • short_desc Bare Silicon AFM Probes for Non-Contact Mode
  • Tags : Contact, Mechanical Properties/Force Curves, Non-Contact/Tapping, Phase Imaging Mode
  • Categories AFM Probes, Golden


Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and are available without coating (no reflective, no conductive coating). The standard chip sizes make these AFM probes compatible with most AFM manufacturers.

Addional Information

Quantity 15, 50, HW, W
Cantilever Length 95
Cantilever Shape Rectangular
Cantilever Thickness 2
Cantilever Width 30
Cantilever Single
Coating None
Force Constant [N/m] 3.1, 11.8, 37.6
Resonant Frequency [kHz] 140, 240, 390
Tip Material Silicon
Tip Tetrahedral (Standard)