Calibrated Single Crystal Diamond Tip-Nanoindentation,/ Nanoscratching/ Lithography-b

  • short_desc Calibrated Unique Probes with Single Crystal Diamond Tip Specially Designed for Nanoindentation, Nanoscratching, and Lithography
  • Tags : Hardened/Enhanced Wear Resistance, Nanoindentation and Lithography
  • Categories AFM Probes, Diamond


These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a board cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and are able to image the indents at high resolution in-situ using the same probe. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

Addional Information

Quantity 5
Cantilever Length 125
Cantilever Shape Rectangular
Cantilever Thickness 4
Cantilever Width 30
Cantilever Single
Coating Au Reflective
Force Constant [N/m] 100, 350, 600
Resonant Frequency [kHz] 500, 750, 1000
Tip Material Diamond
Tip 4 Sided Pyramid