Golden Silico-Nonconductive-Non-Contact Mode-AFM Probes-f

  • short_desc Golden Silicon AFM Probes for Nonconductive Non-Contact Mode
  • Tags : Contact, General Topography, Liquid Scanning, Mechanical Properties/Force Curves, Nanoindentation and Lithography, Non-Contact/Tapping, Phase Imaging Mode
  • Categories AFM Probes, Golden


Our Golden silicon AFM probes have extremely sharp tips for high-resolution imaging and come standard with Au reflective coating. The standard chip sizes make these AFM probes compatible with most AFM manufacturers.

Addional Information

Quantity 15, 50, HW, W
Cantilever Length 125
Cantilever Shape Rectangular
Cantilever Thickness 4
Cantilever Width 40
Cantilever Single
Coating Au Reflective
Force Constant [N/m] 22, 40, 100
Resonant Frequency [kHz] 240, 320, 440
Tip Material Silicon
Tip Tetrahedral (Standard)