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High Accuracy-Contact/ Tipless Etalon AFM Probes
HA-C/TEAP- short_desc High Accuracy, Contact, Tipless Etalon AFM Probes
- Categories AFM Probes, Etalon
Description
AFM Nanoprobes's line of ETALON probes are the next generation of AFM Probes. This innovative product has a very high aspect ratio tip and provides high accuracy and reflection at a very reasonable price. High resonance frequency and accuracy are delivered through a patented manufacturing process—all in a low-noise and easy-to-use product backed by outstanding customer service and support.
Addional Information
Quantity | 15, 50 |
Cantilever 1 Force Constant [N/m] | 0.52, 0.65, 0.78 |
Cantilever 1 Length | 264 |
Cantilever 1 Resonant Frequency [kHz] | 33.3, 37, 40.7 |
Cantilever 1 Thickness | 1.85 |
Cantilever 1 Width | 34 |
Cantilever 2 Force Constant [N/m] | 0.208, 0.26, 0.312 |
Cantilever 2 Length | 364 |
Cantilever 2 Resonant Frequency [kHz] | 17.1, 19, 20.9 |
Cantilever 2 Thickness | 1.85 |
Cantilever 2 Width | 34 |
Cantilever Shape | Rectangular |
Cantilever | Double |
Coating | Au Reflective |
Tip Material | Tipless |
Tip | Tipless |