Scanning Near Field Optical Microscopes probes-without tuning forks-wavelength 400-550nmSNF_OMP-a
- short_desc SNOM probes (wavelength 400-550nm) for Scanning Near Field Optical Microscopes, without tuning forks
AFM Nanoprobes SNOM probes stand up to the most demanding applications, including infrared and UV/visible range. Our tips are made of high-quality polymers and also come in a variety of coatings to support your testing and imaging needs.Material – single mode optical fiber Nufern 405HP.
Probe tip is coated by Al (70nm)/sublayer V (20nm) .
Tip diameter uncoated by Al (tip aperture) 50-100 nm (75±25)
Angle of fiber – about 20 degrees
Maximum optical input power – 400 microWatt
The probes are prepared by chemical etching method.
This method gives the optical efficiency 102 – 104 times better than those obtained by mechanical pulling. GEOMETRICAL & MECHANICAL FIBER SPECIFICATIONS:SNOM PROBE CHARACTERISTICS:
|Tip Material||Single mode optical fiber (Basic Nufern fiber)|