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Top Visual-Precise Positioning-AFM Probes-a
TVPPAP-a- short_desc Top Visual AFM Probes Designed for Precise Positioning Over the Point of Interest
- Tags : General Topography, Liquid Scanning, Mechanical Properties/Force Curves
- Categories AFM Probes, Top Visual
Description
AFM Nanoprobes's Top Visual series probes allow the user precise control over positioning of the tip over a specific point of interest in the sample. This allows for direct, real-time observation of the sample scanning and modification process. Our Top Visual probes are user-friendly and high quality.
Addional Information
| Quantity | 15, 50 |
| Cantilever Length | 140 |
| Cantilever Shape | Rectangular |
| Cantilever Thickness | 5 |
| Cantilever Width | 50 |
| Cantilever | Single |
| Coating | Au Reflective |
| Force Constant [N/m] | 25, 50, 95 |
| Resonant Frequency [kHz] | 200, 300, 400 |
| Tip Material | Single Crystal Silicon |
| Tip | Triangular Pyramid |